Übersetzung und Analyse von Wörtern durch künstliche Intelligenz ChatGPT
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inspection eye - Übersetzung nach russisch
строительное дело
очистной лючок, ревизия, прочистка
![The eye of [[Hurricane Katrina]] viewed from a [[hurricane hunter]] aircraft](https://commons.wikimedia.org/wiki/Special:FilePath/Fly00449 - Flickr - NOAA Photo Library.jpg?width=200 "The eye of [[Hurricane Katrina]] viewed from a [[hurricane hunter]] aircraft")
![cross section]] diagram of a mature tropical cyclone, with arrows indicating air flow in and around the eye](https://commons.wikimedia.org/wiki/Special:FilePath/Hurricane-en.svg?width=200 "cross section]] diagram of a mature tropical cyclone, with arrows indicating air flow in and around the eye")
![[[Hurricane Wilma]] with a pinhole eye](https://commons.wikimedia.org/wiki/Special:FilePath/HurricaneWilma20Oct2005.jpg?width=200 "[[Hurricane Wilma]] with a pinhole eye")
![Detailed view of hurricane Isabel's eye, as viewed from the [[International Space Station]]](https://commons.wikimedia.org/wiki/Special:FilePath/Hurricane Isabel eye from ISS (edit 1).jpg?width=200 "Detailed view of hurricane Isabel's eye, as viewed from the [[International Space Station]]")
![Hurricane Emilia]] in 1994.](https://commons.wikimedia.org/wiki/Special:FilePath/Hurricane emilia (1994) eye close-up.jpg?width=200 "Hurricane Emilia]] in 1994.")
![Typhoon Maysak's]] eye from the [[International Space Station]] on March 31, 2015, displaying a pronounced stadium effect.](https://commons.wikimedia.org/wiki/Special:FilePath/Maysak seen from the ISS 3.jpg?width=200 "Typhoon Maysak's]] eye from the [[International Space Station]] on March 31, 2015, displaying a pronounced stadium effect.")
['aiwɔ:l]
метеорология
облачный вихрь вокруг ядра тайфуна
"глаз бури"
существительное
метеорология
облачный вихрь вокруг ядра тайфуна
«глаз бури»
Definition
Wikipedia
Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method. It is implemented at many stages through the manufacturing process including bare board inspection, solder paste inspection (SPI), pre-reflow and post-re-flow as well as other stages.
Historically, the primary place for AOI systems has been after solder re-flow or "post-production." Mainly because, post-re-flow AOI systems can inspect for most types of defects (component placement, solder shorts, missing solder, etc.) at one place in the line with one single system. In this way the faulty boards are reworked and the other boards are sent to the next process stage.
